Standard stylus profilers can scratch sensitive materials, struggle with high-aspect-ratio features, and take substantial time to map 3D areas. With Accretech’s advanced non-contact 3D optical profiler, this system bridges this gap by combining white light interferometry with high-speed surface analytics to transform quality verification across critical industries.
Join us for this exclusive seminar as we bring together industry measurement insights and a live demonstration.
- Event Details -
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Wednesday, 11 November 2026
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10:00 AM to 12:30 PM (Registration starts at 09:30 AM)
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Cairnhill Metrology Pte Ltd
5 Jalan Kilang Barat #07-05/06 Petro Centre
Singapore 159349
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Why Should You Attend?
- Learn how to inspect small, delicate, or easily deformed parts without contact, eliminating the risk of measurement-induced damage.
- See how to accurately measure 2D dimensions, profiles, heights, angles, radii, and geometric features within a single inspection workflow.
- Explore methods for inspecting complex geometries and hard-to-reach features that are difficult or time-consuming with conventional measuring tools.
- Improve measurement repeatability and consistency by minimising operator influence through automated optical inspection.
Register >>here<< by 6 November 2026 to secure your spot!
For more information, call us at +65 68900041 or email us at sales@cairnhill.com.