Language/言語: English / 日本語
Precision Metrology


View Website

Phoenix X-Ray (GE Sensing & Inspection Technologies GmbH), founded 1997, produces micro- and nano-focus 2D industrial X-ray inspection and 3D industrial computer tomography (micro CT and nano CT) for failure analysis, metrology and inline CT. New possibilities have been opened up for 3D industrial tomography including the inspection and measurement of metal and plastic castings, using Phoenix's high resolution technologies in models including:

  • nanotom m - nanoCT ® system for scientific and industrial computed tomography (micro ct and nano ct) and 3D metrology on a wide sample range
  • nanotom s - first 180 kV / 15 W nanofocus computed tomography (nano ct) system designed for material science and precision injection moulding
  • v|tome|x s - high-resolution system for 2D X-ray inspection and 3D computed tomography (micro ct and nano ct)) as well as for 3D metrology
  • v|tome|x L 240 - high-resolution microfocus computed tomography (micro ct) system for 3D computed tomography
  • v|tome|x L 300 - high-resolution microfocus system for 2D and 3D computed tomography (micro ct) and 2D non-destructive X-ray inspection
  • v|tome|x L 450 - high-resolution microfocus system for 2D and 3D computed tomography (micro ct) and 2D non-destructive X-ray inspection
  • datos|x CT - advanced CT software for automated data acquisition and volume processing.

Peacock

Starrett
This website's content is Copyright © Cairnhill Metrology | Website Designed by Elves Lab Legal & Privacy Enquiry
Enquiry
 *


 *





 


 *


   
 *


   *