V|tome|x M

Powerful versatile X-Ray microfocus CT system for 3D metrology and analysis with up to 300kV / 500W

Scatter|correct: Highly improved CT quality level compared to conventional microfocus cone beam CT
High-flux|target: Maintain high image quality and scan much faster, or with improved accuracy
Dynamic 41|100 detector: Doubled CT resolution at same scanning time or doubled throughput at same quality level compared to state of the art 200 μm pitch DXR detectors
Unique dual|tube configuration for high power μCT as well as high resolution nanoCT®
Metrology|edition for precision measurements with up to 4+L/100 μm referring to VDI 2630 guideline
Optional Production|edition for fully automated high throughput CT inspection
Max. sample size up to 500 mm Ø x 600 mm in height; 3D scanning area max. 290 mm Ø x 400 mm; up to 50 kg