Unique tool for high quality scatter reduced industrial CT scans acquired in significantly shorter scan time


  • Low artifact high precision performance of fan beam CT combined with up to 100 times faster inspection speed of cone beam CT
  • Provides significant quality improvement not only for high scattering materials such as steel and aluminium, but also for composites and multi material samples
  • Better material penetration length at same energy level or same CT quality with less complex CT equipment
  • Proprietary GE technology - exclusively available as option for the industrial mini- and microCT scanner Phoenix V|tome|x C and M as well as upgrade package for installed V|tome|x M systems


  • GE’s proprietary Scatter|correct functionality allows customers to gain CT quality never before reached with industrial flat panel based cone beam CT
  • Combining high precision fan beam CT quality with high throughput of fully automated cone beam CT
  • Clearly improved quantitative volume evaluation, e.g. automatic defect recognition or precise 3D metrology of difficult to penetrate multimaterial objects
  • Significantly increased inspection productivity allowing CT to migrate from R&D applications to serial inspection on the production floor
  • Comparable CT performance by using less complex less energy microCT

Frost & Sullivan Awards

Awarded by Frost & Sullivan as Global Industrial CT Systems Company of the Year 2016.