Our powerful industrial computer tomography (CT) system, designed for 3D metrology and analysis, provides industry-leading magnification at 300kV. It is the world’s first microCT scanner with Scatter|reduce software , to automatically remove scatter artifacts for higher image quality. With a variety of exclusive high performance detectors and proprietary premium CT technologies, the Phoenix V|tome|x M  revolutionises CT inspection and 3D metrology - delivering faster scans and higher throughputs without compromising image quality and measurement precision.

Enhanced reliability with real results
Unique Dual|tube configurations enhance the flexibility. Depending on the inspection task, fast and easy change between the microfocus and nanofocus X-ray tube is possible just by a push of a button

Micro- /nanofocus Dual|tube configuration
300kV / 500W microfocus X-ray tube - specially optimised for CT applications  optionally combined with a high power 180kV / 20W nanofocus X-ray tube for highest precision scans of smaller and lower absorbing samples

AI-based automated defect recognition (ADR)
Proprietary machine learning (ML) based algorithms deliver exceptional Automated Defect Recognition (ADR) across various flaws for e.g. battery anode overhang analysis or typical casting defects. Our AI and data science based ADR library yields greater accuracy and enhanced ease of use compared to conventional ADR approaches, eliminating the need for expert parameterisation skills.

Industry-leading detector performance
The Phoenix V|tome|x M comes standard with our exclusive 4 MP Dynamic 41|200 next-generation photodiode design industrial X-ray detector. It provides 10x increased sensitivity relative to the state of the art 200µm pixel-size DXR detectors producing a 2-3x cycle time increase without image quality impact, making inspections and measurements more efficient and productive. Dynamic 41 digital detector technology means you get up to 2-3x faster CT scans or doubled resolution.

Faster scans with less artifacts
Advanced Scatter|reduce software automatically removes scatter artifacts for artifact-free precision CT results on the quality level of fan-beam CT scanned several hundred times faster with advanced cone-beam CT.

Unprecedented scan speed
Our proprietary High-flux|target allows for higher power on a smaller focal spot, so you can cut scan time in half.

Automated CT process
Boost your CT scanning performance with a fully automated, robot-based workflow and 3D analysis in real-time.

Flash! optimised 2D failure detection
There is more information in an images acquired within a 2D application or slide taken from a CT scan visible for the human eye. The system includes Waygate Technologies X|act NDT inspection software with industry leading Flash!™ intelligent image processing technology unveil details that are not visible before. Users benefit from two versions:

• Flash! (for general NDT use such as casting inspection)
• Flash! Electronics (optimised for Electronics inspection)

Precision metrology
The Ruby|plate technology, in the Phoenix V|tome|x M covers the full intent of VDI2630 in all directions with a single scan.  It achieves 3.8µm + L/100 at the VDI 2630 positions, and all other positions can be verified in less than ten minutes using Easy|Calib.

• CT Scanning & Metrology at Higher Accuracy, Higher Speeds
• High-quality images via Scatter|correct technology
• High-speed scans thanks to exclusive detectors technology and patented
• Outstanding reliable metrology precision
• Highest versatility due to optional 300kV micro- and 180kV nanofokus Dual|tube setup
• Industry-leading microfocus magnification at 300kV

• Download our comprehensive Industrial & Portable Metrology Catalogue here.