Microme|x / Nanome|x Neo

Precision tools for inspecting semiconductors, PCBs and more

The Phoenix Microme|x Neo and Nanome|x Neo provide high-resolution 2D X-ray technology and 3D computed tomography( CT) scanning in one system, enabling non-destructive testing (NDT) of electronic components – such as semiconductors, PCBs, lithium-ion batteries -- in industrial, automotive, aviation and consumer electronics industries. With innovative engineering coupled with ultra-high positioning accuracy, phoenix microme|x neo and nanome|x neo are ideally suited for industrial X-ray electronics inspections in process and quality control, failure analysis and R&D.


  • Automated inspection in micrometer range with easy to program CAD based μAXI
  • Active cooling for high dynamic, live imaging at 180 kV configurations
  • Brilliant live imaging and fast data acquisition for 3D CT / PlanarCT scanning
  • 30 frames per second with Waygate Technologies’ highly dynamic DXR flat panel detector
  • Up to 2 times faster data acquisition at same high image quality level with diamond|window
  • Option provided for 3D CT scans within up to 10 seconds

Frost & Sullivan 2023 Award