Nikon is proud to present the MM series of Measuring Microscopes, which incorporate key performance features expected in an advanced next generation measuring microscope:

• Greater Accuracy
• Digital Imaging and Vision Processing Metrology
• Larger Stage for Increased Workpiece Handling
• Non Contact Z-height Measurements
• Coordination with Data Processing Systems

• Stellar new features enhance Z-axis measurement accuracy
  TTL Laser AF (Universal Type)
  Focusisng Aid (FA)
  Motorized Z-axis movement (LM Model Stands)


• Improved illuminators broaden observation ranges
  Built-in continuous light control
  LED illuminator
  8-segment LED ring light CYN-E1


• Improved interface with Data Processor and Software
  Data Processor DP-E1
  Data processing Software E-MAX Series
  3rd-party DRO Connectables (S Models)