Upright microscopes for various episcopic observations. The microscopes are ideal for semiconductor and material inspections.
Enhanced Usability and Improved Maintenance
With the modular design and the high colour-rendering light source , the LV150NA LED and LV150N LED microscopes allow complementary optical contrast techniques on one microscope stand. Example applications include inspection of semiconductor substrates and device packaging, flat panel displays (FPD), electronic components and innovative materials using dedicated episcopic contrast techniques.
Highlights
ECLIPSE LV150NA LED and LV150N LED
Various observation methods
Brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence and two-beam interferometry are available with the use of LV150NA LED and LV150N LED.
Intelligent Digital Communication
Objective lenses, light intensity, aperture and epi-contrast can all be detected using the LV-ECON controller and NIS-Elements software. The LV150N LED uses the LV-NU5IN and LV-INAD to detect objective lenses and report.
Digital Sight Series
Used together with Digital Sight cameras for microscopes, high-definition images can be efficiently captured. Images can be processed using the NIS-Elements software to conduct measurement and analysis.
Wide range of accessories
The latest manual revolving nosepieces achieve stopping accuracy* that is 50% greater than previous models. Other accessories such as microscope stands and LED lamphouses can be selected according to the observation method and purpose.
CFI60-2 Optical Series
Nikon offers various objective lenses designed to match the observations required with the microscopes. Colour aberration correction for the lenses result in greatly reduced colour distortion and excellent image quality.
Integration with Wafer Loader
Integrating with the NWL200 wafer loader, the LV150N LED can meet wafer inspection needs such as micro inspections.
The ECLIPSE LV100NDA LED and LV100ND LED series of flexible, modular, upright microscopes from Nikon is designed for episcopic and diascopic optical contrast techniques. The instruments can be supplied with digital imaging camera accessories and are ideal for material inspection in many industrial applications.
Enhanced Usability and Improved Maintenance
The renewed microscopes will strengthen the comprehensive range of industrial microscopy solutions, by adopting a high colour-rendering LED light source.
Nikon CFI60-2 Optical Series
Nikon’s innovative design enables clear imaging techniques, including high contrast, brightfield, darkfield, polarisation (POL), differential interference contrast (DIC) and double beam interferometry optical contrast.
Nikon Digital Sight Cameras
All Nikon Digital Sight cameras efficiently capture images of a sample and deliver them to the image processing software of the NIS-Elements suite, together with microscope data on the objective lens used, magnification setting and light intensity.
Universal Optical Contrast Methods
Reflected light: brightfield, darkfield, polarising (POL), differential interference contrast (DIC), epi-fluorescence and two-beam interferometry.
Transmitted light: brightfield, darkfield, polarising (POL), differential interference contrast (DIC) and phase contrast.
Modular Component Accessories
From lamphouse to eyepieces, components are selected to match a user’s application. They include stands, stages, objectives, nosepieces, optical heads, eyepieces, digital cameras, filters and contrast technique accessories.
Intelligent Digital Communication
The LV100NDA LED detects and controls objective lens value, position, light intensity, aperture and contrast via Nikon software.
The LV100ND LED detects and reports on the objective lens used by LV-NU5I and LV-INAD.
Ergonomic Design
Optimal positioning of operator controls and a variable angle eye-tube allow fatigue-free work, providing a right-way-up, right-way-around image for correctly observing materials, semiconductors and industrial components.