High-resolution industrial CT in a compact, configurable platform.
From fine-detail analysis of small parts to inspection of denser, medium-sized components, the V|tome|x S Neo adapts to a wide range of inspection needs - combining dual-tube flexibility, tailored detector performance, and a compact footprint just over 3 m² for seamless lab integration.
Dual-Tube CT
Flexible inspection: Switch between penetration and precision at the push of a button with 240kV microfocus and 180kV nanofocus, no recalibration needed.
Detector flexibility NEW
Configurable design: Choose the detector that fits your task, from higher throughput imaging to finer detail for demanding applications.
Metrology|edition NEW
Extend into measurement: Add CT-based dimensional measurement with Metrology|edition. Supports CAD comparison, wall thickness analysis, and reverse engineering.
Compact CT Inspection
More Capability, Less Space: Full 2D radiography and 3D CT in just over 3m² of footprint, with room for samples up to 400mm in diameter and 15kg in weight.
Proprietary Technology NEW
Faster scans, better images: Proprietary High|Flux target technology and high sensitivity detectors deliver superior image quality at significantly reduced scan times.
Built for the space between inspection extremes
V|tome|x S Neo is designed for teams that need more than a narrow, single-purpose system but do not want the cost, complexity, or footprint of a much larger platform. It brings together high-detail inspection, broad application flexibility, and everyday usability in a format that fits naturally into real lab environments.
- Max voltage: 240kV
- Detail detectability: <0.2 µm
- Compact footprint: 3.25 m²
- Max scan diameter: 400 m
Download
- Download our comprehensive Industrial & Portable Metrology Catalogue here.